Effect of Deposition Time on Structural, Morphological and Surface Reflectance Properties of Electrodeposited Vanadium Oxide Thin Films
Keywords:
Electrodeposition, X-ray diffraction study, Vanadium oxide, thin films, reflectance spectraAbstract
Vanadium oxide thin films were prepared by potentiostatic mode of electrodeposition method. The effect of deposition time on the structural, morphological and surface reflectance properties was studied by means of X-ray diffraction study, Scanning electron microscopy and UV-Visible reflectance spectroscopy. Structural and morphological analyses revealed that the deposited vanadium oxide is polycrystalline in nature with porous nanostructure. The surface reflectance study of the vanadium oxide thin films was carried by means of reflectance spectra. The UV-Visible reflectance study showed that the reflectance of VO thin film is in the range between 5 to 45 %.
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