Simulation Tool to Determine Presence of Impurities in an Organic Compound Using IR Spectroscopy

Authors

  • Suyoga Srinivas  PESIT South Campus, Department of Information Science and Engineering,Bangalore, Karnataka, India
  • Ujwal Unnikrishnan  PESIT South Campus, Department of Information Science and Engineering,Bangalore, Karnataka, India
  • Yashas A  PESIT South Campus, Department of Information Science and Engineering,Bangalore, Karnataka, India
  • Revana Siddappa  PESIT South Campus, Department of Science and Humanities,Bangalore, Karnataka, India

Keywords:

IR Spectroscopy, Interaction of IR Radiation with compound.

Abstract

The popularity of using IR Spectroscopy in elucidation of organic and inorganic compounds in both research and industry has driven development of an array of IR Spectral analysis of tools and databases. IR Spectroscopy is used to identify and study the component chemicals. It relies on infrared radiations and can provide detailed information about the structure, dynamics, and functional groups involved. The paper outlines the development of simulation tool to obtain the IR Spectra of the compound by entering its name. The position of the peaks is obtained through interaction of infrared radiation with the various functional groups present in the given compound.

References

  1. https://webbook.nist.gov/chemistry
  2. https://en.wikipedia.org/wiki
  3. Elementary Organic Spectroscopy by YR Sharma

International Journal of Scientific Research in Science and Technology

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Published

2018-05-05

Issue

Volume 5, Issue 3, May-June-2018

Section

Research Articles

License

Copyright (c) IJSRST

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
Suyoga Srinivas, Ujwal Unnikrishnan, Yashas A, Revana Siddappa "Simulation Tool to Determine Presence of Impurities in an Organic Compound Using IR Spectroscopy " International Journal of Scientific Research in Science and Technology(IJSRST), Online ISSN : 2395-602X, Print ISSN : 2395-6011,Volume 5, Issue 3, pp.77-79, May-June-2018.