Determination of Uniformity Value Response and Calibration Factors TLD Chips Using GAMMA Sources

Authors

  • Adelia Oktaviani  Department of Physics, Faculty of Science and Matematics, Diponegoro University, Semarang, Indonesia
  • Evi Setiawati  Department of Physics, Faculty of Science and Matematics, Diponegoro University, Semarang, Indonesia
  • Eko Hidayanto  Department of Physics, Faculty of Science and Matematics, Diponegoro University, Semarang, Indonesia
  • Nunung Nuraeni  Metrology Safety Technology Research Center and Nuclear Quality National Innovation Research Agency, Jakarta Indonesia

DOI:

https://doi.org//10.32628/IJSRST52310643

Keywords:

TLD-100, calibration factor, standard deviation, TLD response, gamma rays.

Abstract

The response of the Thermoluminescence Dosimeter (TLD) varies from one type of TLD to another depending on the material, thickness, holder, filter/absorber on each chip, type of radiation, energy and direction of radiation. This research was conducted to determine the uniformity value of the TLD chip response and to determine the calibration factor of the TLD chip using a gamma radiation source. The TLD response must be known so that the measurement results are accurate. TLD-100 irradiation in this study used a radiation source Cesium – 137. TLD used as many as 150 pieces with a large irradiation dose of 5 mSv. The irradiated TLD-100 response resulted in a standard deviation of 1% to 5% with each response corresponding to its standard deviation value. The results of the irradiation in this study the value of the calibration factor obtained for the standard deviation values of 1%, 2%, 3%, 4%, and 5% which ranged between 0,121 mSv/nC – 0,206 mSv/nC. With a large uniformity of variation in the range of 2,25% - 14%.

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International Journal of Scientific Research in Science and Technology

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Published

2023-12-30

Issue

Volume 10, Issue 6, November-December-2023

Section

Research Articles

License

Copyright (c) IJSRST

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This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
Adelia Oktaviani, Evi Setiawati, Eko Hidayanto, Nunung Nuraeni, " Determination of Uniformity Value Response and Calibration Factors TLD Chips Using GAMMA Sources, International Journal of Scientific Research in Science and Technology(IJSRST), Online ISSN : 2395-602X, Print ISSN : 2395-6011, Volume 10, Issue 6, pp.296-300, November-December-2023. Available at doi : https://doi.org/10.32628/IJSRST52310643