Design And Implementation of High-Performance Timing-Error-Tolerant Circuit Using 45nm

Authors

  • Sampathirao Srihari Raju  M.Tech, VLSI & EMBEDDED SYSTEMS , Department of ECE, UCEK(A), JNTUK, Kakinada, India.
  • Smt. Jhansi Rani Kaka  Assistant Professor, Department of ECE, UCEK(A), JNTUK, Kakinada, India.

Keywords:

Error tolerant, bit-interleaving, clock gating, error correction and detection, time borrowing.

Abstract

This work uses the clock technique to show timing error and timing error tolerant circuits. Timing faults are recognized, and fixed by adjusting the clock of the flip flop while changing the system clock and using the fewest logics available. To deal with a timing error, numerous techniques have been introduced. Conventional strategies that can minimize a timing issue, on the other end, were indeed concentrated mainly on time-delaying signaling pathways & overly complicated processes, culminating in some kind of a timing difficulty for clock-based devices while also peripheral devices operating costs. In this paper, we report a novel timing-error-tolerant paradigm based on a simple way for asynchronously clarifying a timing issue. To heal a temporal lag, the procedure involves investing time in a clock-based application and changing the clock within a flip-flop. The suggested model, in particular, has considerably decreased memory requirements due to its compact construction, as compared to earlier timing-error-tolerant devices that can truly recover the fault instantly. In order to examine this text, it is also necessary to be familiar with a number of other basic terms, including channel estimate, error systems, softness error, time error tolerant system, and timing error.

References

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Published

2022-10-30

Issue

Section

Research Articles

How to Cite

[1]
Sampathirao Srihari Raju, Smt. Jhansi Rani Kaka "Design And Implementation of High-Performance Timing-Error-Tolerant Circuit Using 45nm" International Journal of Scientific Research in Science and Technology(IJSRST), Online ISSN : 2395-602X, Print ISSN : 2395-6011,Volume 9, Issue 5, pp.309-314, September-October-2022.